74LCX646 Datasheet, PDF (7/13 Pages) Fairchild Semiconductor – Low Voltage Octal Transceiver/Register with 5V Tolerant Inputs and Outputs

M74LCX646
AC ELECTRICAL CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
V_CC
C_L R_L t_s = t_r ^{-40 to 85 °C}
-55 to 125 °C Unit
(V)
(pF) (Ω) (ns) _{Min. Max. Min. Max.}
t_PLH t_PHL Propagation Delay
2.7
1.5
9.5
1.5
9.5
Time (CAB or CBA
50 500 2.5
ns
to An or Bn)
3.0 to 3.6
1.5
8.5
1.5
8.5
t_PLH t_PHL Propagation Delay
2.7
1.5
8.0
1.5
8.0
Time (An to Bn or Bn
50 500 2.5
ns
to An)
3.0 to 3.6
1.5
7.0
1.5
7.0
t_PLH t_PHL Propagation Delay
2.7
1.5
9.5
1.5
9.5
Time (SAB or SBA
50 500 2.5
ns
to An or Bn)
3.0 to 3.6
1.5
8.5
1.5
8.5
t_PZL t_PZH Output Enable Time
2.7
(G, DIR to An, Bn) _{3.0 to 3.6}
50 500 2.5
1.5
1.5
9.5
8.5
1.5
1.5
9.5
8.5
ns
t_PLZ t_PHZ Output Disable Time
2.7
(G, DIR to An, Bn) _{3.0 to 3.6}
50 500 2.5
1.5
1.5
9.5
8.5
1.5
1.5
9.5
8.5
ns
t_S
Setup Time, HIGH or
2.7
2.5
2.5
LOW level Data to
50 500 2.5
ns
CAB, CBA
3.0 to 3.6
2.5
2.5
t_h
Hold Time, HIGH or
2.7
1.5
1.5
LOW level Data to
50 500 2.5
ns
CAB, CBA
3.0 to 3.6
1.5
1.5
t_W
CAB, CBA Pulse
2.7
4.0
4.0
Width, HIGH or
50 500 2.5
ns
LOW
3.0 to 3.6
3.3
3.3
f_MAX
Clock Pulse
Frequency
3.0 to 3.6 50 500 2.5 150
150
MHz
t_OSLH Output To Output
3.0 to 3.6 50 500 2.5
1.0
t_OSHL
Skew Time (note1,
2)
1.0
ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW (t_OSLH = | t_PLHm - t_PLHn|, t_OSHL = | t_PHLm - t_PHLn|)
2) Parameter guaranteed by design
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
V_CC
(V)
T_A = 25 °C
Unit
Min. Typ. Max.
C_IN
Input Capacitance
3.3
V_IN = 0 to V_CC
6
pF
C_I/O I/O Capacitance
3.3
V_IN = 0 to V_CC
10
pF
C_PD Power Dissipation Capacitance
3.3
(note 1)
f_IN = 10MHz
V_IN = 0 or V_CC
37
pF
1) C_PD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I_CC(opr) = C_PD x V_CC x f_IN + I_CC/8 (per circuit)
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