SMP50_07 Datasheet, PDF (6/11 Pages) STMicroelectronics – Trisil for telecom equipment protection

Characteristics
SMP50 / SMTPA / TPA
Figure 9. Test circuit 1 for Dynamic I_BO and V_BO parameters
100 V / µs, di /dt < 10 A / µs, Ipp = 50 A
2Ω
U
10 µF
45 Ω
66 Ω _{470 Ω}
83 Ω
0.36 nF
46 µH
KeyTek 'System 2' generator with PN246I module
1 kV / µs, di /dt < 10 A / µs, Ipp = 10 A
26 µH
250 Ω
47 Ω
46 µH
U
60 µF
12 Ω
KeyTek 'System 2' generator with PN246I module
Figure 10. Test circuit 2 for I_BO and V_BO parameters
K
ton = 20ms
R1 = 140Ω
220V 50Hz
Vout
R2 = 240Ω
DUT
1/4
IBO
measurement
VBO
measurement
TEST PROCEDURE
Pulse test duration (tp = 20ms):
● for Bidirectional devices = Switch K is closed
● for Unidirectional devices = Switch K is open
VOUT selection:
● Device with VBO > 200V ➔ VOUT = 250 VRMS, R1 = 140Ω
● Device with VBO ≥ 200V ➔ VOUT = 480 VRMS, R2 = 240Ω
Figure 11. Test circuit 3 for dynamic I_H parameters
R
V_BAT = - 48 V
D.U.T
Surge generator
6/11
This is a GO-NOGO test which allows to confirm the holding current (IH) level in a
functional test circuit.
TEST PROCEDURE
1/ Adjust the current level at the IH value by short circuiting the AK of the D.U.T.
2/ Fire the D.U.T. with a surge current ➔ IPP = 10A, 10/1000µs.
3/ The D.U.T. will come back off-state within 50ms maximum.