HCC40108B Datasheet, PDF (6/14 Pages) STMicroelectronics – 4 x 4 MULTIPORT REGISTER

HCC/HCF40108
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25 ^oC, CL = 50 pF, RL = 200 KΩ,
typical temperature coefficent for all VDD values is 03 %/^oC, all input rise and fall times= 20 ns)
Symbol
Parameter
tPLH Propagation Delay Time
tPHL Clock or Write Enable to Q
Propagation Delay Time
Read or Write Address to Q
t_PZH 3-State Disable Delay Time
t_PHZ
tPZL 3-State Display Delay Time
tPLZ
t_TLH Output Transition Time
tTHL
t_setup
Setup Time
Data to Clock t_s(D)
Setup Time
Write Enable to Clock t_s(WE)
Setup Time
Write Address to Clock ts(WA)
t_r, t_s Clock Rise and Fall Time
t_hold Hold Time
Data to Clock t_s(D)
Hold Time
Write Enable to Clock ts(WE)
Hold Time
Write Address to Clock ts(WA)
t_W Clock Pulse Width
Clock or Write Enable t_W(CL)
Clock Pulse Width
Write Address t_W(WA)
fCL Maximum Clock Input Frequency
Test Conditions
VDD (V)
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
Min.
0
0
0
250
100
70
250
100
70
220
100
80
270
130
80
330
140
90
350
130
90
300
150
90
1.5
3.5
4.5
Value
Typ.
360
140
100
300
120
85
100
50
40
130
60
50
100
50
40
-95
-35
-20
125
50
35
125
50
35
110
50
40
135
65
40
165
70
45
175
65
45
150
75
45
3
7
9
Max.
720
280
200
600
240
170
200
100
80
260
120
100
200
100
80
15
5
5
Unit
ns
ns
ns
ns
ns
µs
ns
ns
MHz
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