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STDLED524 Datasheet, PDF (5/22 Pages) STMicroelectronics – Very low intrinsic capacitance
STDLED524,STFILED524,STPLED524,STULED524
Electrical characteristics
Table 7. Source-drain diode
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
ISD
ISDM (1)
VSD (2)
Source-drain current
Source-drain current (pulsed)
Forward on voltage
ISD = 2.5 A, VGS = 0
2.5 A
-
10 A
-
1.6 V
trr
Reverse recovery time
ISD = 2.5 A, di/dt = 100 A/µs
173
ns
Qrr Reverse recovery charge
VDD= 60 V
- 778
µC
IRRM Reverse recovery current
(see Figure 20)
9
A
trr
Reverse recovery time
ISD = 2.5 A, di/dt = 100 A/µs
196
ns
Qrr Reverse recovery charge
VDD= 60 V TJ = 150 °C
- 941
µC
) IRRM Reverse recovery current
(see Figure 20)
10
A
t(s 1. Pulse width limited by safe operating area.
c 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5%.
Produ Table 8. Gate-source Zener diode
te Symbol
Parameter
Test conditions
ole BVGSO
Gate-source breakdown
voltage
IGS= ± 1 mA, ID = 0
Min. Typ. Max. Unit
30 -
-V
Obs The built-in back-to-back Zener diodes have been specifically designed to enhance not only
) - the device’s ESD capability, but also to make them capable of safely absorbing any voltage
t(s transients that may occasionally be applied from gate to source. In this respect, the Zener
voltage is appropriate to achieve efficient and cost-effective protection of the device’s
Obsolete Produc integrity. The integrated Zener diodes thus eliminate the need for external components.
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