LCDP1521_06 Datasheet, PDF (5/11 Pages) STMicroelectronics – Dual line programmable transient voltage suppressor for SLIC protection

LCDP1521
3 Functional holding current (I_H) test circuit: go no-go test
2.6 Parameters related to diode and protection thyristor
(T_amb = 25° C, unless otherwise specified)
Symbol
Test conditions
I_RM
V_{GATE / LINE} = -1V V_RM = -150 V
V_{GATE / LINE} = -1V V_RM = -150 V
Tc=25° C
Tc=85° C
C
V_R = 50 V bias, V_RMS = 1 V, F = 1 MHz
V_R = 2 V bias, V_RMS = 1 V, F = 1 MHz
Typ.
Max.
Unit
5
50
µA
20
48
pF
3 Functional holding current (I_H) test circuit:
go no-go test
R
Surge generator
V_BAT = - 100V
D.U.T
This is a GO-NO GO test which confirms the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
– Adjust the current level at the IH value by short circuiting the D.U.T.
– Fire the D.U.T. with a surge current : IPP = 10 A, 10/1000 µs.
– The D.U.T. will come back to the off-state within a duration of 50 ms max.
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