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74LVX20M Datasheet, PDF (4/8 Pages) STMicroelectronics – LOW VOLTAGE CMOS DUAL 4-INPUT NAND GATE WITH 5V TOLERANT INPUTS
74LVX20
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)
Test Condition
Value
Symbol
Parameter
VCC CL
(V) (pF)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
tPLH tPHL Propagation Delay 2.7 15
Time
2.7 50
3.3(*) 15
8.6 1.0 10.5 1.0 11.5
13.5 1.0 15.4 1.0 16.4
4.1 6.2 1.0 7.5 1.0 9.5 ns
3.3(*) 50
6.6 9.7 1.0 11.0 1.0 12.0
tOSLH Output To Output
2.7 50
tOSHL
Skew Time (note1,
2)
3.3(*)
50
0.5 1.0
1.5
1.5
0.5 1.0
1.5
1.5 ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance 3.3
4 10
10
10 pF
CPD Power Dissipation
Capacitance
3.3
19
pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/2 (per gate)
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