STM32F102X8 Datasheet, PDF (39/76 Pages) STMicroelectronics – Medium-density USB access line,ARM-based 32b MCU with 64/128KB Flash,USB FS interface,6 timers, ADC&8 com. interfaces

STM32F102x8, STM32F102xB
Electrical characteristics
5.3.6 External clock source characteristics
High-speed external user clock generated from an external source
The characteristics given in Table 19 result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 8.
Table 19. High-speed external user clock characteristics
Symbol
Parameter
Conditions
Min Typ Max Unit
f_{HSE_ext} User external clock source frequency⁽¹⁾
1
8
25
MHz
V_HSEH
V_HSEL
OSC_IN input pin high level voltage
OSC_IN input pin low level voltage
0.7V_DD
V_SS
V_DD
V
0.3V_DD
t_w(HSE)
t_w(HSE)
t_r(HSE)
t_f(HSE)
C_in(HSE)
OSC_IN high or low time⁽¹⁾
OSC_IN rise or fall time⁽¹⁾
OSC_IN input capacitance⁽¹⁾
5
ns
20
5
pF
DuCy_(HSE) Duty cycle
45
55
%
I_L
OSC_IN Input leakage current
V_SS ≤ V_IN ≤ V_DD
±1
µA
1. Guaranteed by design, not tested in production.
Low-speed external user clock generated from an external source
The characteristics given in Table 20 result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 8.
Table 20. Low-speed external user clock characteristics
Symbol
Parameter
Conditions
f_{LSE_ext} User external clock source frequency⁽¹⁾
V_LSEH OSC32_IN input pin high level voltage
V_LSEL OSC32_IN input pin low level voltage
t_w(LSE)
t_w(LSE)
OSC32_IN high or low time⁽¹⁾
t_r(LSE)
t_f(LSE)
C_in(LSE)
OSC32_IN rise or fall time⁽¹⁾
OSC32_IN input capacitance⁽¹⁾
DuCy_(LSE) Duty cycle
I_L
OSC32_IN Input leakage current
1. Guaranteed by design, not tested in production.
V_SS ≤ V_IN ≤ V_DD
Min
Typ
Max
0.7V_DD
V_SS
32.768
1000
V_DD
0.3V_DD
450
50
5
30
70
±1
Unit
kHz
V
ns
pF
%
µA
Doc ID 15056 Rev 4
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