STM8T141 Datasheet, PDF (35/50 Pages) STMicroelectronics – On-chip integrated voltage regulator

STM8T141
Electrical characteristics
9.6
9.6.1
9.6.2
EMC characteristics
Susceptibility and emission tests are performed on a sample basis during product
characterization.
Both the sample and its applicative hardware environment (Figure 10) are mounted on a
dedicated specific EMC board defined in the IEC61967-1 standard.
Functional EMS (electromagnetic susceptibility)
While running in the above described environment the product is stressed by two
electromagnetic events until a failure occurs.
● ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test complies with the IEC 1000-4-2
standard.
● FTB: A burst of fast transient voltage (positive and negative) is applied to V_DD and V_SS
through a 100 pF capacitor, until a functional disturbance occurs. This test complies
with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed. The test results are given in
Table 19 based on the EMS levels and classes defined in application note AN1709.
Prequalification trials
Table 19. EMS data
Symbol
Parameter
Conditions
V_FESD
V_EFTB
Voltage limits to be applied on any pin to
induce a functional disturbance
V_DD 5 V, T_A+25 °C, SO8
(Narrow) package, complies
with IEC 1000-4-2
Fast transient voltage burst limits to be
V_DD5 V, T_A+25 °C, SO8
applied through 100pF on V_DD and V_SS pins _{(Narrow) package, complies}
to induce a functional disturbance
with IEC 1000-4-4
Level/class
1B
4A
Doc ID 15699 Rev 7
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