M950X0-W Datasheet, PDF (35/46 Pages) STMicroelectronics – Compatible with SPI bus serial interface

M950x0-W M950x0-R M950x0-DF
DC and AC parameters
Table 18. AC characteristics (M950x0-W, device grade 6)⁽¹⁾
Test conditions specified in Table 9 and Table 12
Symbol Alt.
Parameter
(2)
V_CC = 2.5 to 5.5 V _{VCC = 4.5 to 5.5 V Unit}
Min. Max. Min. Max.
f_C
f_SCK Clock frequency
D.C.
10
D.C.
20 MHz
t_SLCH t_CSS1 S active setup time
30
-
15
-
ns
t_SHCH t_CSS2 S not active setup time
30
-
15
-
ns
t_SHSL
t_CS S deselect time
40
-
20
-
ns
t_CHSH
t_CSH S active hold time
30
-
15
-
ns
t_CHSL
t_CH(3)
t_CL(3)
t_CLCH(4)
t_CHCL(4)
- S not active hold time
t_CLH Clock high time
t_CLL Clock low time
t_RC Clock rise time
t_FC Clock fall time
30
-
15
-
ns
40
-
20
-
ns
40
-
20
-
ns
-
2
-
2
µs
-
2
-
2
µs
t_DVCH
t_DSU Data in setup time
10
-
5
-
ns
t_CHDX
t_DH Data in hold time
10
-
10
-
ns
t_HHCH
- Clock low hold time after HOLD not active
30
-
15
-
ns
t_HLCH
- Clock low hold time after HOLD active
30
-
15
-
ns
t_CLHL
- Clock low set-up time before HOLD active
0
-
0
-
ns
t_CLHH
- Clock low set-up time before HOLD not active 0
-
0
ns
t_SHQZ(4) t_DIS Output disable time
-
40
-
20
ns
t_CLQV(5)
t_V Clock low to output valid
-
40
-
20
ns
t_CLQX
t_QLQH(4)
t_QHQL(4)
t_HO Output hold time
t_RO Output rise time
t_FO Output fall time
0
-
0
-
ns
-
40
-
20
ns
-
40
-
20
ns
t_HHQV
t_HLQZ(4)
t_LZ HOLD high to output valid
t_HZ HOLD low to output high-Z
-
40
-
20
ns
-
40
-
20
ns
t_W
t_WC Write time
-
5
-
5
ms
1. The timing values described in this table are recommended for new designs.
2. Only for devices identified by process letter K.
3. t_CH + t_CL must never be lower than the shortest possible clock period, 1/f_C(max).
4. Characterized only, not tested in production.
5.
te_CqLuQaVl
must
to (or
bgerecaotemrptahtaibnl)et_Cw_Lit_Qh_Vt;_CinL
(aclllooctkhelorwcatismees,):t_Cif_LthmeuSstPbI _ebuesqumaal stote(roorfgferresaateRr _tehaadn)setCtu_LQp_Vti+mt_Se_Ut._SU
=
0
ns,
t_CL
can
be
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