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M74HCT132_01 Datasheet, PDF (3/8 Pages) STMicroelectronics – QUAD 2-INPUT SCHMITT NAND GATE
M74HCT132
DC SPECIFICATIONS
Symbol
Parameter
VP High Level
Threshold Voltage
VN Low Level
Threshold Voltage
VH Hysteresis Voltage
VOH High Level Output
Voltage
VOL Low Level Output
Voltage
II
Input Leakage
Current
ICC Quiescent Supply
Current
Test Condition
VCC
(V)
4.5
5.5
4.5
5.5
4.5
5.5
4.5
IO=-20 µA
IO=-4.0 mA
4.5
IO=20 µA
IO=4.0 mA
5.5 VI = VCC or GND
5.5 VI = VCC or GND
Value
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
1.2 1.55 1.9 1.2 1.9 1.2 1.9
V
1.4 1.75 2.1 1.4 2.1 1.4 2.1
0.5 0.85 1.2 0.5 1.2 0.5 1.2
V
0.6 1.1 1.4 0.6 1.4 0.6 1.4
0.4 0.7 1.4 0.4 1.4 0.4 1.4
V
0.4 0.7 1.5 0.4 1.5 0.4 1.5
4.4 4.5
4.4
4.4
V
4.18 4.31
4.13
4.10
0.0 0.1
0.17 0.26
0.1
0.33
0.1
V
0.40
± 0.1
±1
± 1 µA
1
10
20 µA
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6ns)
Test Condition
Value
Symbol
Parameter
VCC
(V)
tTLH tTHL Output Transition
Time
4.5
tPLH tPHL Propagation Delay
Time
4.5
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
8 15
19
22 ns
19 30
38
45 ns
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance
5 10
10
10 pF
CPD Power Dissipation
Capacitance (note
45
pF
1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC
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