74V2T00 Datasheet, PDF (3/7 Pages) STMicroelectronics – DUAL 2-INPUT NAND GATE

74V2T00
DC SPECIFICATION
Test Condition
Value
Symbol
Parameter
V_IH
V_IL
V_OH
V_OL
I_I
I_CC
∆I_CC
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
Low Level Output
Voltage
Input Leakage
Current
Quiescent Supply
Current
Additional Worst
Case Supply
Current
V_CC
(V)
4.5 to
5.5
4.5 to
5.5
4.5
4.5
4.5
4.5
0 to
5.5
I_O=-50 µA
I_O=-8 mA
I_O=50 µA
I_O=8 mA
V_I = 5.5V or GND
5.5 V_I = V_CC or GND
One Input at 3.4V,
5.5 other input at V_CC
or GND
T_A = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
2
2
2
V
0.8
0.8
0.8 V
4.4 4.5
4.4
4.4
V
3.94
3.8
3.7
0.0 0.1
0.1
0.1 V
0.36
0.44
0.55
± 0.1
± 1.0
± 1.0 µA
1
10
20 µA
1.35
1.5
1.5 mA
AC ELECTRICAL CHARACTERISTICS (Input t_r = t_f = 3ns)
Test Condition
Value
Symbol
Parameter
V_CC C_L
(V) (pF)
t_PLH Propagation Delay 5.0 (*) 15
t_PHL ^Time
5.0 (*) 50
T_A = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
5.0 7.0 1.0 8.0 1.0 8.0
ns
5.5 8.0 1.0 9.0 1.0 9.0
(*) Voltage range is 5.0V ± 0.5V
CAPACITANCE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
C_IN Input Capacitance
C_PD Power Dissipation
Capacitance
(note 1)
T_A = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
4 10
10
10 pF
10.5
pF
1) C_PD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average current can be obtained by the following equation. I_CC(opr) = C_PD x V_CC x f_IN + I_CC/2
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