STD4NK50ZT4 Datasheet, PDF (2/13 Pages) STMicroelectronics – N-CHANNEL 500V - 2.4W - 3A TO-220/TO-220FP/DPAK/IPAK

STP4NK50Z - STP4NK50ZFP - STD4NK50Z - STD4NK50Z-1
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
V_DS
Drain-source Voltage (V_GS = 0)
V_DGR
Drain-gate Voltage (R_GS = 20 kΩ)
V_GS
Gate- source Voltage
I_D
Drain Current (continuous) at T_C = 25°C
I_D
Drain Current (continuous) at T_C = 100°C
I_DM ( ) Drain Current (pulsed)
P_TOT
Total Dissipation at T_C = 25°C
Derating Factor
V_ESD(G-S) Gate source ESD(HBM-C=100pF, R=1.5KΩ)
dv/dt (1) Peak Diode Recovery voltage slope
V_ISO
Insulation Withstand Voltage (DC)
T_j
Operating Junction Temperature
T_stg
Storage Temperature
( ) Pulse width limited by safe operating area
(1) ISD ≤3 A, di/dt ≤200A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX.
(*) Limited only by maximum temperature allowed
STP4NK50Z
3
1.9
12
45
0.36
-
Value
STP4NK50ZFP
500
500
± 30
3 (*)
1.9 (*)
12 (*)
20
0.16
2800
4.5
2500
STD4NK50Z
STD4NK50Z-1
3 (*)
1.9 (*)
12 (*)
45
0.36
-
-55 to 150
THERMAL DATA
Rthj-case
Rthj-amb
T_l
Thermal Resistance Junction-case (Max)
Thermal Resistance Junction-ambient (Max)
Maximum Lead Temperature For Soldering Purpose
TO-220 TO-220FP
2.78
6.25
62.5
300
DPAK
IPAK
2.78
100
Unit
V
V
V
A
A
A
W
W/°C
V
V/ns
V
°C
°C/W
°C/W
°C
AVALANCHE CHARACTERISTICS
Symbol
Parameter
I_AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T_j max)
E_AS
Single Pulse Avalanche Energy
(starting T_j = 25 °C, I_D = I_AR, V_DD = 50 V)
Max Value
Unit
3
A
120
mJ
GATE-SOURCE ZENER DIODE
Symbol
Parameter
BV_GSO
Gate-Source Breakdown
Voltage
Test Conditions
Igs=± 1mA (Open Drain)
Min.
30
Typ.
Max. Unit
V
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
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