AN3182 Datasheet, PDF (16/18 Pages) STMicroelectronics – This application note describes the methods and techniques for measuring

Least square method
AN3182
Therefore, the calibration parameter matrix X can be determined by the least square method
as:
Equation 20
where:
[ ] X = w^T ⋅ w ^−1 ⋅ w^T ⋅ Y
Equation 21
w^{T means matrix transpose}
[ ] w^T ⋅ w ^{−1 means matrix inverse}
16/18
Doc ID 17289 Rev 1