ST10F272B Datasheet, PDF (140/181 Pages) STMicroelectronics – 16-bit MCU with 256 Kbyte Flash memory and 12/20 Kbyte RAM

Electrical characteristics
ST10F272B/ST10F272E
Note:
24.7.3
These four error quantities are explained below using Figure 39.
Offset error
Offset error is the deviation between actual and ideal A/D conversion characteristics when
the digital output value changes from the minimum (zero voltage) 00 to 01 (Figure 39, see
OFS).
Gain error
Gain error is the deviation between the actual and ideal A/D conversion characteristics when
the digital output value changes from the 3FE to the maximum 3FF, once offset error is
subtracted. Gain error combined with offset error represents the so-called full-scale error
(Figure 39, OFS + GE).
Quantization error
Quantization error is the intrinsic error of the A/D converter and is expressed as 1/2 LSB.
Non-linearity error
Non-Linearity error is the deviation between actual and the best-fitting A/D conversion
characteristics (see Figure 39):
● Differential Non-Linearity error is the actual step dimension versus the ideal one (1
LSB_IDEAL).
● Integral Non-Linearity error is the distance between the center of the actual step and
the center of the bisector line, in the actual characteristics. Note that for Integral Non-
Linearity error, the effect of offset, gain and quantization errors is not included.
Bisector characteristic is obtained drawing a line from 1/2 LSB before the first step of the
real characteristic, and 1/2 LSB after the last step again of the real characteristic.
Total unadjusted error
The Total Unadjusted Error specifies the maximum deviation from the ideal characteristic:
the number provided in the Data Sheet represents the maximum error with respect to the
entire characteristic. It is a combination of the Offset, Gain and Integral Linearity errors. The
different errors may compensate each other depending on the relative sign of the Offset and
Gain errors. Refer to Figure 39, see TUE.
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