MIL-PRF-19500 Datasheet, PDF (14/19 Pages) STMicroelectronics – SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N2484, 2N2484UA, 2N2484UB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC

MIL-PRF-19500/376E
TABLE I. Group A inspection - Continued.
Inspection 1/
Method
MIL-STD-750
Conditions
Symbol
Limit
Min
Max
Unit
Subgroup 4 - continued.
Small-signal short- circuit
forward current transfer ratio
3206
VCE = 5 V dc; IC = 1 mA dc;
f = 1 kHz
hfe
250
900
Open circuit output
capacitance
3236
VCB = 5 V dc; IE = 0;
100 kHz ≤ f ≤ 1 MHz
Cobo
5.0
pF
Input capacitance (output
3240 VEB = 0.5 V dc; IC = 0;
Cibo
6.0
pF
open-circuited)
100 kHz ≤ f ≤ 1 MHz
Noise figure
Noise figure
Noise figure
Noise figure (wideband)
Subgroups 5 and 6
3246 f = 100 Hz; VCE = 5 V dc; IC = 10
NF1
µA dc; Rg = 10 kΩ;
3246 f = 1 kHz; VCE = 5 V dc; IC = 10
NF2
µA dc; Rg = 10 kΩ;
3246 f = 10 kHz; VCE = 5 V dc; IC = 10
NF3
µA dc; Rg = 10 kΩ;
3246 Noise bandwidth = 10 Hz to 15.7
NF4
kHz; VCE = 5 V dc; IC = 10 µA dc;
Rg = 10 kΩ;
7.5
dB
3
dB
2
dB
3
dB
Not applicable
Subgroup 7 4/
Decap internal visual (design
verification)
2075 n = 1 device, c = 0
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A
failure in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
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