MTC20454 Datasheet, PDF (13/15 Pages) STMicroelectronics – QUAD INTEGRATED ADSL CMOS ANALOG FRONT END CIRCUIT

MTC20454
Test
Four different test modes are implemented. The functional test mode allows separate access to different
analog parts of the circuit in order to check some characteristics. Various test configurations are available
via the CTRLIN interface.
The digital core scan and the I/O nand tree test modes are dedicated for the detection of hardware process
flaws in digital elements and IOs.
The last test mode allows to put the outputs in the tristate mode in order to be able to perform the ESD
qualification tests.
Test is enabled with a high level n the TEST pin. The actual value of TX1 and TX0 bits on the rising edge
of the TEST pin will set the test mode.
The available test modes and their corresponding signal values are summarized in the following table:
Table 6. Tests mode accessMTC20454
TX1
TX0
Test Mode
0
0
functional test (enable various tests accesses via CTRLIN interface
0
1
digital scan chain test
1
0
I/O nand tree
1
1
Tristate output for ESD
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