M29F040B_05 Datasheet, PDF (12/20 Pages) STMicroelectronics – 4 Mbit (512Kb x8, Uniform Block) Single Supply Flash Memory

M29F040B
Table 10. DC Characteristics
(T_A = 0 to 70°C, –40 to 85°C or –40 to 125°C)
Symbol
Parameter
Test Condition
Min
I_LI Input Leakage Current
I_LO Output Leakage Current
0V ≤V_IN ≤V_CC
0V ≤V_OUT ≤V_CC
I_CC1 Supply Current (Read)
E = V_IL, G = V_IH, f = 6MHz
I_CC2 Supply Current (Standby) TTL
E = V_IH
I_CC3 Supply Current (Standby) CMOS
E = V_CC ±0.2V
I_CC4 ⁽¹⁾ Supply Current (Program/Erase)
Program/Erase
Controller active
V_IL Input Low Voltage
–0.5
V_IH Input High Voltage
2
V_OL Output Low Voltage
I_OL = 5.8mA
Output High Voltage TTL
V_OH
Output High Voltage CMOS
I_OH = –2.5mA
I_OH = –100µA
2.4
V_CC –0.4
V_ID Identification Voltage
11.5
I_ID Identification Current
A9 = V_ID
V_LKO ⁽¹⁾
Program/Erase Lockout Supply
Voltage
3.2
Note: 1. Sampled only, not 100% tested.
2. T_A = 25 °C, V_CC = 5V.
Typ. ⁽²⁾
7
30
Max Unit
±1
µA
±1
µA
15
mA
1
mA
100
µA
20
mA
0.8
V
V_CC +0.5 V
0.45
V
V
V
12.5
V
100
µA
4.2
V
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