LIS3DH Datasheet, PDF (10/42 Pages) STMicroelectronics – ultra low-power high performance 3-axes “nano” accelerometer

Mechanical and electrical specifications
2
Mechanical and electrical specifications
LIS3DH
2.1
Mechanical characteristics
Vdd = 2.5 V, T = 25 °C unless otherwise noted ^(a)
Table 3.
Symbol
Mechanical characteristics
Parameter
Test conditions
Min. Typ.⁽¹⁾ Max.
FS
So
TCSo
TyOff
TCOff
An
Vst
Top
FS bit set to 00
Measurement range^{(2) FS bit set to 01}
FS bit set to 10
FS bit set to 11
FS bit set to 00
Sensitivity
FS bit set to 01
FS bit set to 10
FS bit set to 11
Sensitivity change vs
temperature
FS bit set to 00
Typical zero-g level
offset accuracy^(3),(4)
FS bit set to 00
Zero-g level change
vs temperature
Max delta from 25 °C
Acceleration noise
density
FS bit set to 00, Normal Mode
(Table 9), ODR = 100Hz
FS bit set to 00
X axis
Self-test
FS bit set to 00
output change^(5),(6),(7) _{Y axis}
FS bit set to 00
Z axis
Operating
temperature range
±2.0
±4.0
±8.0
±16.0
1
2
4
12
0.01
±40
±0.5
220
276
276
984
-40
+85
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical zero-g level offset value after MSL3 preconditioning.
4. Offset can be eliminated by enabling the built-in high pass filter.
5. The sign of “Self-test output change” is defined by CTRL_REG4 STsign bit, for all axes.
6. Self-test output changes with the power supply. “Self-test output change” is defined as
OUTPUT[LSb]_{(CTRL_REG4 ST bit=1)} - OUTPUT[LSb]_{(CTRL_REG4 ST bit=0)}. 1LSb=1mg, ±2 g Full-scale.
7. Output data reach 99% of final value after 1 ms when enabling self-test mode, due to device filtering.
Unit
g
mg/digit
mg/digit
mg/digit
mg/digit
%/°C
mg
mg/°C
ug/sqrt(H
z)
LSb
LSb
LSb
°C
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a. The product is factory calibrated at 2.5 V. The operational power supply range is from 1.71V to 3.6 V.
Doc ID 17530 Rev 1