M3488 Datasheet, PDF (1/18 Pages) STMicroelectronics – 256 x 256 DIGITAL SWITCHING MATRIX

M3488
256 x 256 DIGITAL SWITCHING MATRIX
. 256 INPUT AND 256 OUTPUT CHANNEL
. ^{CMOS DIGITAL SWITCHING MATRIX COM-}
PATIBLE WITH M088
BUILDING BLOCK DESIGNED FOR LARGE
. CAPACITY ELECTRONIC EXCHANGES, SUB-
SYSTEMS AND PABX
NO EXTRA PIN NEEDED FOR NOT-BLOCK-
ING SINGLE STAGE AND HIGHER CAPACITY
SYNTHESIS BLOCKS (512 or 1024 channels)
. EUROPEAN TELEPHONE STANDARD COM-
PATIBLE (32 serial channels per frame)
. PCM INPUTS AND OUTPUTS MUTUALLY
COMPATIBLE
. ACTUAL INPUT-OUTPUT CHANNEL CON-
NECTIONS STORED AND MODIFIED VIA AN
ON CHIP 8-BIT PARALLEL MICROPROCES-
SOR INTERFACE
. TYPICAL BIT RATE : 2Mbit/s
. TYPICAL SYNCHRONIZATION RATE : 8KHz
(time frame is 125µs)
. 5V P0WER SUPPLY
. CMOS & TTL INPUT/OUTPUT LEVELS COM-
PATIBLE
. HIGH DENSITY ADVANCED 1.2µm HCMOS3
PROCESS
PRELIMINARY DATA
DIP40
PQFP44
ORDERING NUMBERS:
M3488B1
M3488Q1
Main instructions controlled by the microproc-
essor interface
. CHANNEL CONNECTION/DISCONNECTION
. OUTPUT CHANNEL DISCONNECTION
. INSERTION OF A BYTE ON A PCM OUTPUT
CHANNEL/DISCONNECTION
. TRANSFER TO THE MICROPROCESSOR OF
A SINGLE PCM OUTPUT CHANNEL SAMPLE
. TRANSFER TO THE MICROPROCESSOR OF
. ^{A SINGLE OUTPUT CHANNEL CONTROL}
WORD
TRANSFER TO THE MICROPROCESSOR OF
A SELECTED 0 CHANNEL PCM INPUT DATA
ABSOLUTE MAXIMUM RATINGS
Symbol
V_CC
VI
V_O
IO
Ptot
Tstg
T_op
Parameter
Supply Voltage
Input Voltage
Off State Output Voltage
Current at Digital Outputs
Total Package Power Dissipation
Storage Temperature Range
Operating Temperature Range
Test Conditions
Unit
-0.3 to 7
V
-0.3 to VCC+0.3
V
-0.3 to V_CC+0.3
V
30
mA
1.5
W
-65 to 150
°C
0 to 70
°C
Stresses above those l isted under ” Absolute Maximum Ratings” may cause permanent damage to the devi ce. This is a stress
rati ngs only and functional operation of the device at these or any other conditions above those indicated in the operating con-
ditions of this specificati on is not implied. Exposure to absolute maximum rating conditions for extended periods may affect devi ce
reliabili ty.
November 1994
1/18
This is advanced information on a new product now in development or undergoing evaluation. Details are subject to change without notice.