AN4022 Datasheet, PDF (1/15 Pages) STMicroelectronics – TVS short pulse dynamic resistance measurement and correlation with TVS clamping voltage during ESD

AN4022
Application note
TVS short pulse dynamic resistance measurement
and correlation with TVS clamping voltage during ESD
Introduction
This application note is addressed to technical engineers and designers to explain how
STMicroelectronics measure and specify dynamic resistance R_D in protection devices.
This parameter can be conveniently and accurately used to calculate the remaining voltage
after a transient voltage suppressor or a filter including protection, especially for devices
dedicated to protect against very fast transient surges such as ESD.
Market environment
Mobile phones, computers and their peripherals are sensitive electronic products. Each of
these products has to be protected against electrostatic discharge using components able
to clamp the high voltages generated in transients defined by each standard level such as
IEC 61000-4-2. Knowing the clamping voltage level of transient voltage suppressors is a key
point in the protection definition during the circuit design to get reliable and robust products.
This application note describes
 The clamping characteristic
 Dynamic resistance and how to measure it
 Predicted results versus measured results
 TLP measurements
October 2013
DocID022589 Rev 2
1/15
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