AN1528 Datasheet, PDF (1/18 Pages) STMicroelectronics – The testflash is a ST reserved flash area that contains device information

AN1528
APPLICATION NOTE
ST92F120/F124/150/F250 TESTFLASH
INTRODUCTION
The testflash is a ST reserved flash area that contains device information, flash parameters
and the boot code. This boot code contains the protocol for In-System Programming and the
routines for E3^TM initialization and management. The testflash is programmed by ST at the
factory before shipping and cannot be erased or programmed in user mode.
The purpose of this document is to give an sufficiently accurate description of the testflash
content to allow the user to access to the different parameters and routines included in the
testflash.
After an overview of the testflash content, the document describes the different routines that
can be called at any time by the user code. The last part of this document provides guidelines
on the way to handle an E3^TM failure.
1 GLOSSARY AND ACRONYMS
The terms, abbreviations and acronyms used in this document are listed below and described
in alphabetical order.
– CONFxR: CONFiguration x Register
– NVAPR: Non Volatile Access Protection Register
– NVCSSx: NV Complementary Sector Status x
– NVESPx: NV Emulation Status Pointer x
– NVPWDx: Non Volatile PassWorD x
– NVWPR: Non Volatile Write Protection Register
– REDxR: REDundancy x Register
– VCSSx: Volatile Complementary Sector Status x
– VESPx: Volatile Emulation Status Pointer x
AN1528/0105
Rev. 3.0
1/18
1