AN1181 Datasheet, PDF (1/7 Pages) STMicroelectronics – ELECTROSTATIC DISCHARGE SENSITIVITY MEASUREMENT

AN1181
APPLICATION NOTE
ELECTROSTATIC DISCHARGE SENSITIVITY
MEASUREMENT
by Microcontroller Division Applications
This application note describes a procedure for determining the susceptibility of microcon-
troller devices to ESD damage.
1 REFERENCE DOCUMENTS
1.1 REFERENCE DOCUMENTS (INTERNAL ST REFERENCES)
s 0061692 "Reliability Test Specification for Product Qualification"
s SOP2614 "Reliability Procedure for Product Qualification"
1.2 OTHER REFERENCES
s CDF-AEC-Q100-002 "Human Body Model ESD test"
s CDF-AEC-Q100-003 "Machine Model ESD test"
s ESD Association standard draft DS5.3 - 1993 Draft Standard for ESD sensitivity text-
Charged Device Model (CDM) Component Testing
s ESD Association standard draft DS5.3.1 - 1996 Charged Device Model (CDM) Non-
Socketed Mode
s JEDEC STANDARD JESD22-C101 "Field- induced Charged Device Model"
s JEDEC STANDARD JESD22-A114A "Human Body Model"
s JEDEC STANDARD JESD22-A115A "Machine Model"
s ESD Association standard draft DS5.2 - 1996 "Machine Model"
s ESD Association Standard ESD STM 5.1 - 1998 "Human Body Model"
s EIAJ Provisional Standard EDX-4702 "Charged Device Model"
AN1181/0100
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