MBM29LV320TE Datasheet, PDF (41/68 Pages) Fujitsu Component Limited. – 32 M (4 M X 8/2 M X 16) BIT

MBM29LV320TE/BE80/90/10
■ AC CHARACTERISTICS
• Read Only Operations Characteristics
Symbol
Parameter
JEDEC Standard
Condi-
tion
Read Cycle Time
tAVAV
Address to Output Delay
tAVQV
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
tELQV
tGLQV
tEHQZ
tGHQZ
tAXQX
⎯
CE to BYTE Switching Low or High ⎯
tRC
tACC
tCE
tOE
tDF
tDF
tOH
tREADY
tELFL
tELFH
⎯
CE = VIL
OE = VIL
OE = VIL
⎯
⎯
⎯
⎯
⎯
⎯
Value
80*
90*
10* Unit
Min Max Min Max Min Max
80 ⎯ 90
100 ⎯ ns
⎯ 80 ⎯ 90 ⎯ 100 ns
⎯ 80 ⎯ 90 ⎯ 100 ns
⎯ 30 ⎯ 35 ⎯ 35 ns
⎯ 25 ⎯ 30 ⎯ 30 ns
⎯ 25 ⎯ 30 ⎯ 30 ns
0 ⎯ 0 ⎯ 0 ⎯ ns
⎯ 20 ⎯ 20 ⎯ 20 μs
⎯ 5 ⎯ 5 ⎯ 5 ns
* : Test Conditions :
Output Load : 1 TTL gate and 30 pF (MBM29LV320TE80, MBM29LV320BE80)
100 pF (MBM29LV320TE90/10, MBM29LV320BE90/10)
Input rise and fall times : 5 ns
Input pulse levels : 0.0 V or 3.0 V
Timing measurement reference level
Input : 1.5 V
Output : 1.5 V
Device
Under
Test
CL
3.3 V
Diode = 1N3064
or Equivalent
2.7 kΩ
6.2 kΩ
Diode = 1N3064
or Equivalent
Notes : CL = 30 pF including jig capacitance (MBM29LV320TE80, MBM29LV320BE80)
CL = 100 pF including jig capacitance (MBM29LV320TE90/10, MBM29LV320BE90/10)
Test Conditions
Retired ProductɹDS05-20894-5E_July 31, 2007
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