AM29F160D Datasheet, PDF (32/47 Pages) Advanced Micro Devices – 16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory

TEST CONDITIONS
Device
Under
Test
C_L
6.2 kΩ
Note:
Diodes are IN3064 or equivalents.
DATA SHEET
5.0 V
2.7 kΩ
Table 11. Test Specifications
Test Condition
Output Load
70, 75
90
Unit
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
Input Pulse Levels
5
20
ns
0.0–3.0 0.45–2.4 V
Input timing measurement
reference levels
1.5
0.8, 2.0 V
Output timing measurement
reference levels
1.5
0.8, 2.0 V
Figure 9. Test Setup
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
30
Am29F160D
Am29F160D_00_D10 April 23, 2010