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S29CD016G Datasheet, PDF (1/91 Pages) SPANSION – 16 Megabit (512 K x 32-Bit) CMOS 2.5 Volt-only Burst Mode, Dual Boot, Simultaneous Read/Write Flash Memory | |||
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S29CD016G
16 Megabit (512 K x 32-Bit)
CMOS 2.5 Volt-only Burst Mode, Dual Boot,
Simultaneous Read/Write Flash Memory
Data Sheet
Distinctive Characteristics
Architecture Advantages
 Simultaneous Read/Write operations
â Two bank architecture: large bank/ small bank
â Data can be read from bank while executing erase/
program functions in other bank
â Zero latency between read and write operations
 User-Defined x32 Data Bus
 Dual Boot Block
â Top and bottom boot sectors in the same device
 Flexible sector architecture
â Eight 8 Kbytes, thirty 64 Kbytes, and eight 8 Kbytes
sectors
 Manufactured on 170 nm process technology
 SecSi (Secured Silicon) Sector (256 Bytes)
â Factory locked and identifiable: 16 bytes for secure,
random factory Electronic Serial Number; remainder
may be customer data programmed by Spansionâ¢
â Customer lockable: Can be read, programmed, or
erased just like other sectors. Once locked, data
cannot be changed
 Programmable Burst interface
â Interface to any high performance processor
â Modes of Burst Read Operation:
â Linear Burst: 4 double words and 8 double words
with wrap around
 Program Operation
â Ability to perform synchronous and asynchronous
write operations of burst configuration register
settings independently
 Single power supply operation
â Optimized for 2.5 to 2.75 volt read, erase, and
program operations
 Compatibility with JEDEC standards (JC42.4)
â Software compatible with single-power supply Flash
â Backward-compatible with AMD Am29LV and Am29F
and Fujitsu MBM29LV and MBM29F flash memories
Performance Characteristics
 High performance read access
â Initial/random access times as fast as 54 ns
â Burst access time as fast as 9 ns for ball grid array
package
 Ultra low power consumption
â Burst Mode Read: 90 mA @ 66 MHz max,
â Program/Erase: 50 mA max
â Standby mode: CMOS: 60 µA max
 1 million write cycles per sector typical
 20 year data retention typical
 VersatileI/O⢠control
â Device generates data output voltages and tolerates
data input voltages as determined by the voltage on
the VIO pin
â 1.65 V to 2.75 V compatible I/O signals
â 3.6 V tolerant I/O signals
Software Features
 Persistent Sector Protection
â A command sector protection method to lock
combinations of individual sectors and sector groups
to prevent program or erase operations within that
sector (requires only VCC levels)
 Password Sector Protection
â A sophisticated sector protection method to lock
combinations of individual sectors and sector groups
to prevent program or erase operations within that
sector using a user-definable 64-bit password
 Supports Common Flash Interface (CFI)
 Unlock Bypass Program Command
â Reduces overall programming time when issuing
multiple program command sequences
 Data# Polling and toggle bits
â Provides a software method of detecting program or
erase operation completion
Hardware Features
 Program Suspend/Resume & Erase Suspend/
Resume
â Suspends program or erase operations to allow
reading, programming, or erasing in same bank
 Hardware Reset (RESET#), Ready/Busy# (RY/
BY#), and Write Protect (WP#) inputs
 ACC input
â Accelerates programming time for higher throughput
during system production
 Package options
â 80-pin PQFP
â 80-ball Fortified BGA
Publication Number S29CD016_00 Revision A Amendment 4 Issue Date November 5, 2004
The contents of this document are subject to change without notice. This document may contain information on a Spansion product under development by Spansion LLC. Spansion
LLC reserves the right to change or discontinue work on any product without notice. The information in this document is provided âas isâ without warranty or guarantee of any
kind as to its accuracy, completeness, operability, fitness for particular purpose, merchantability, non-infringement of third-party rights, or any other warranty, express, implied, or
statutory. Spansion LLC assumes no liability for any damages of any kind arising out of the use of the information in this document.
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