LV244 Datasheet, PDF (4/4 Pages) System Logic Semiconductor – OCTAL BUFFER/LINE DRIVE; 3-STATE

SL74LV244
AC ELECTRICAL CHARACTERISTICS (C_L=50 pF, t_r=t_f=6.0 ns)
Symbol
Parameter
Test
V_CC
Guaranteed Limit
conditions
V
25°C
-40°C to
85°C
125°C
Unit
min max min max min max
t_PHL, t_PLH Propagation delay , 1An V_I = 0 V or V_CC 1.2 - 100 -
125
-
150
ns
to 1Yn, 2An to 2Yn
Figure 1 and 3 2.0 - 24 -
30
-
36
* - 15 -
19
-
23
t_PHZ t_PLZ Propagation delay, 1OE to V_I = 0 V or V_CC 1.2 - 140 -
175
-
210
ns
1Yn, 2OE to 2Yn
Figure 2 and 4 2.0 - 30 -
35
-
41
* - 20 -
24
-
28
t_PZH t_PZL Propagation delay, 1OE to V_I = 0 V or V_CC 1.2 - 140 -
175
-
210
ns
1Yn, 2OE to 2Yn
Figure 2 and 4 2.0 - 32 -
40
-
48
* - 20 -
25
-
30
t_THL, t_TLH Output Transition Time, V_I = 0 V or V_CC 1.2 - 60 -
75
-
90
ns
Any Output
Figure 1 and 3 2.0 - 16 -
20
-
24
* - 10 -
13
-
15
C_I Input capacitance
C_PD Power dissipation
capacitance (per one
channel)
3.0 - 7.0 - 7.0 - 7.0 pF
V_I = 0 V or V_CC
- 50 -
-
-
-
pF
* V_CC = 3.3 ± 0.3 V
1A_nor 2A_n
tr
90%
10% ^50%
t_PLH
1Y_n or 2Y_n
50% ^90%
10%
t_TLH
tf
t_PHL
V_CC
GND
t_THL
1OE or 2OE
t _PZL
1Y_nor 2Y _n
t _PZH
1Y_nor 2Y _n
50%
50%
50%
t _PLZ
t PHZ
V_CC
GND
V_CC
V_OL
V_OH
GND
Figure 1. Switching Waveforms
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
*
C_L
Figure 2. Switching Waveforms
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
1k
*
C_L
Connect to V _{C C} when
testing t_{P LZ} and t_{P Z L}
Connect to GND when
testing t_{P HZ} and t_{P Z H}
* Includes all probe and jig capacitance
Figure 3. Test Circuit
* Includes all probe and jig capacitance
Figure 4. Test Circuit
SLS ^{System Logic}
Semiconductor
4