SP526_06 Datasheet, PDF(21/24 Page) Sipex Corporation – WAN Multi-Mode Serial Transceiver

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SP526_06 Datasheet, PDF (21/24 Pages) Sipex Corporation – WAN Multi-Mode Serial Transceiver

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potential to the system and humidity will tend to

change the discharge current. For example, the

rise time of the discharge current varies with the

approach speed.

The Contact Discharge Method applies the ESD

current directly to the EUT. This method was

devised to reduce the unpredictability of the

ESD arc. The discharge current rise time is

constant since the energy is directly transferred

without the air-gap arc. In situations such as

hand held systems, the ESD charge can be directly

discharged to the equipment from a person already

holding the equipment. The current is transferred

on to the keypad or the serial port of the equipment

directly and then travels through the PCB and

finally to the IC.

The circuit models in Figures 35 and 36 represent

the typical ESD testing circuits used for all three

methods. The CS is initially charged with the DC

power supply when the first switch (SW1) is on.

Now that the capacitor is charged, the second

switch (SW2) is on while SW1 switches off. The

voltage stored in the capacitor is then applied

through RS, the current limiting resistor, onto the

device under test (DUT). In ESD tests, the SW2

switch is pulsed so that the device under test

receives a duration of voltage.

For the Human Body Model, the current limiting

resistor (RS) and the source capacitor (CS) are

1.5kâ¦ an 100pF, respectively. For IEC-1000-4-

2, the current limiting resistor (RS) and the source

capacitor (CS) are 330â¦ an 150pF, respectively.

The higher C value and lower R value in the

IEC1000-4-2 model are more stringent than the

Human Body Model. The larger storage capacitor

injects a higher voltage to the test point when

SW2 is switched on. The lower current limiting

resistor increases the current charge onto the test

point.

NET1/NET2 European Compliancy

As with all of Sipex's previous multi-protocol

serial transceiver ICs, the drivers and receivers

have been designed to meet all the requirements

to NET1/NET2. The SP526 is also tested and

adheres to all the NET1/2 physical layer testing

and the ITU Series V specifications. Please note

that although the SP526, as with its predecessors,

adheres to NET1/2 testing, any complex or

unusual configuration should be double-checked

to ensure NET compliance. Consult the factory

for details.

Rev: C Date:2/1/06

SP526 MultiâMode Serial Transceiver

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