SP3223H Datasheet, PDF (18/23 Pages) Sipex Corporation – High Speed Intelligent +3.0V to +5.5V RS-232 Transceivers

ESD TOLERANCE
The SP3223H/3243H series incorporates
ruggedized ESD cells on all driver output and
receiver input pins. The ESD structure is
improved over our previous family for more
rugged applications and environments sensitive
to electro-static discharges and associated
transients.
The Human Body Model has been the generally
accepted ESD testing method for semi-
conductors. This method is also specified in
MIL-STD-883, Method 3015.7 for ESD testing.
The premise of this ESD test is to simulate the
human body’s potential to store electro-static
energy and discharge it to an integrated circuit.
The simulation is performed by using a test
model as shown in Figure 25. This method will
test the IC’s capability to withstand an ESD
transient during normal handling such as in
manufacturing areas where the ICs tend to be
handled frequently.
For the Human Body Model, the current limiting
resistor (R_S) and the source capacitor (C_S) are
1.5kΩ an 100pF, respectively.
R_CC
DC Power
Source
SW1
R_SS
C_SS
SW2
Device
Under
Test
Figure 25. ESD Test Circuit for Human Body Model
Rev. 6/30/03
SP3223H +3.0V to +5.5V RS-232 Transceivers
18
© Copyright 2003 Sipex Corporation