SP3223B Datasheet, PDF (18/24 Pages) Sipex Corporation – Intelligent +3.0V to +5.5V RS-232 Transceivers

ESD TOLERANCE
The SP3223B/3243B series incorporates
ruggedized ESD cells on all driver output and
receiver input pins. The ESD structure is
improved over our previous family for more
rugged applications and environments sensitive
to electro-static discharges and associated
transients.
The Human Body Model has been the generally
accepted ESD testing method for semiconductors.
This method is also specified in MIL-STD-883,
Method 3015.7 for ESD testing. The premise of
this ESD test is to simulate the human body’s
potential to store electrostatic energy and
discharge it to an integrated circuit. The
simulation is performed by using a test model as
shown in Figure 30. This method will test the
IC’s capability to withstand an ESD transient
during normal handling such as in manufacturing
areas where the ICs tend to be handled frequently.
For the Human Body Model, the current limiting
resistor (R_S) and the source capacitor (C_S) are
1.5kΩ and 100pF, respectively.
R_CC
DC Power
Source
SW1
R_SS
C_SS
SW2
Device
Under
Test
Figure 30. ESD Test Circuit for Human Body Model
Rev. 6/30/03
SP3223B/3243B +3.0V to +5.5V RS-232 Transceivers
18
© Copyright 2003 Sipex Corporation