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SSF7509B Datasheet, PDF (3/8 Pages) Silikron Semiconductor Co.,LTD. – Advanced MOSFET process technology | |||
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Test circuits and Waveforms
EAS Test Circuit:
Gate charge test circuit:
SSF7509B
Switching Time Test Circuit:
Switching Waveforms:
Notes:
â Calculated continuous current based on maximum allowable junction temperature.
â¡Repetitive rating; pulse width limited by max. junction temperature.
â¢The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
â£The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
©Silikron Semiconductor CO., LTD.
2014.01.06
www.silikron.com
Version : 1.0
page 3 of 8
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