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SSF4004 Datasheet, PDF (1/5 Pages) Silikron Semiconductor Co.,LTD. – Advanced trench process technology | |||
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SSF4004
Feathers:
ï® Advanced trench process technology
ï® Special designed for Convertors and power controls
ï® High density cell design for ultra low Rdson
ï® Fully characterized Avalanche voltage and current
ï® Avalanche Energy 100% test
ID=200A
BV=40V
Rdson=4 mΩï¼max.ï¼
Description:
The SSF4004 is a new generation of high voltage and low
current NâChannel enhancement mode trench power
MOSFET. This new technology increases the device reliability
and electrical parameter repeatability. SSF4004 is assembled
in high reliability and qualified assembly house.
Application:
ï® Power switching application
ï® Commercial-industrial application
SSF4004 TOP View (TO220)
Absolute Maximum Ratings
Parameter
ID@Tc=25 ÙC
Continuous drain current,VGS@10V
ID@Tc=100ÙC
IDM
PD@TC=25ÙC
Continuous drain current,VGS@10V
Pulsed drain current â
Power dissipation
Linear derating factor
VGS
dv/dt
Gate-to-Source voltage
Peak diode recovery voltage
EAS
EAR
TJ
TSTG
Single pulse avalanche energy â¡
Repetitive avalanche energy
Operating Junction and
Storage Temperature Range
Max.
200
140
800
238
2.0
±20
31
520
TBD
â55 to +175
Units
A
W
W/ CÙ
V
v/ns
mJ
ÙC
Thermal Resistance
Parameter
RθJC
RθJA
Junction-to-case
Junction-to-ambient
Min.
Typ.
Max.
â
0.63
â
â
â
62
Units
ÙC/W
Electrical Characteristics @TJ=25 ÙC (unless otherwise specified)
Parameter
Min. Typ.
BVDSS
RDS(on)
VGS(th)
IDSS
Drain-to-Source breakdown voltage 40 â
Static Drain-to-Source on-resistance â 3.5
Gate threshold voltage
2.0 â
Drain-to-Source leakage current
ââ
ââ
Gate-to-Source forward leakage
ââ
IGSS
Gate-to-Source reverse leakage
ââ
©Silikron Semiconductor Corporation
2009.7.10
Max. Units
Test Conditions
âV
VGS=0V,ID=250μA
4 mΩ
VGS=10V,ID=30A
4.0 V
VDS=VGS,ID=250μA
2
VDS=40V,VGS=0V
10 uA VDS=40V,VGS=0V,TJ=150ÙC
100
nA
-100
VGS=20V
VGS=-20V
Version: 1.1
page 1of5
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