SI4822-A10 Datasheet, PDF (9/24 Pages) Silicon Laboratories – BROADCAST ANALOG TUNING DIGITAL DISPLAY AM/FM/SW RADIO RECEIVER

Si4822/26-A10
Table 6. AM/SW Receiver Characteristics^{1, 2}
(V_DD = 2.7 to 3.6 V, TA = 0 to 70 °C)
Parameter
Input Frequency
Symbol
f_RF
Test Condition
Medium Wave (AM)
Short Wave (SW)
Min Typ Max
504 — 1750
2.3 — 28.5
Unit
kHz
MHz
Sensitivity^3,4,5
Large Signal Voltage Handling⁵
Power Supply Rejection Ratio⁵
Audio Output Voltage^3,6,8
Audio S/N^3,4,6
Audio THD^3,6
Antenna Inductance^5,7
Powerup/Band Switch Time⁵
(S+N)/N = 26 dB
—
30
—
µV EMF
THD < 8%
— 300 —
∆V_DD = 100 mV_RMS, 100 Hz —
40
—
—
54
—
—
45
—
mV_RMS
dB
mV_RMS
dB
—
0.1
—
%
180 — 450
µH
From powerdown
—
— 110
ms
Notes:
1. Additional testing information is available in “AN603: Si4822/26/40/44 DEMO Board Test Procedure.”
Volume = maximum for all tests. Tested at RF = 520 kHz.
2. To ensure proper operation and receiver performance, follow the guidelines in “AN602: Si4822/26/40/44 Antenna,
Schematic, Layout, and Design Guidelines.” Silicon Laboratories will evaluate schematics and layouts for qualified
customers.
3. FMOD = 1 kHz, 30% modulation, 2 kHz channel filter.
4. B_AF = 300 Hz to 15 kHz, A-weighted.
5. Guaranteed by characterization.
6. V_IN = 5 mVrms.
7. Stray capacitance on antenna and board must be < 10 pF to achieve full tuning range at higher inductance levels.
8. Tested in Digital Volume Mode.
Table 7. Reference Clock and Crystal Characteristics
(V_DD = 2.7 to 3.6 V, T_A = 0 to 70 °C)
Parameter
XTALI Supported Reference Clock
Frequencies
Reference Clock Frequency
Tolerance for XTALI
Crystal Oscillator Frequency
Crystal Frequency Tolerance
Board Capacitance
Symbol Test Condition
Reference Clock
Crystal Oscillator
Min
Typ
Max Unit
—
32.768
—
kHz
–100
—
100
ppm
—
32.768
—
kHz
–100
—
100
ppm
—
—
3.5
pF
Rev.1.0
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