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SI4836-A10 Datasheet, PDF (7/21 Pages) Silicon Laboratories – BROADCAST MECHANICAL TUNING AM/FM/SW RADIO RECEIVER | |||
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Si4836-A10
Table 5. AM/SW Receiver Characteristics1, 2
(VDD = 2.7 to 3.6 V, TA = â15 to 85 °C)
Parameter
Input Frequency
Symbol
fRF
Test Condition
Medium Wave (AM)
Short Wave (SW)
Min Typ Max
504 â 1750
2.3 â 28.5
Unit
kHz
MHz
Sensitivity3,4,5
Large Signal Voltage Handling5
Power Supply Rejection Ratio5
Audio Output Voltage3,6,8
Audio S/N3,4,6
Audio THD3,6
Antenna Inductance5,7
(S+N)/N = 26 dB
â
30
â
µV EMF
THD < 8%
â 300 â
âVDD = 100 mVRMS, 100 Hz â
40
â
â
60
â
â
55
â
mVRMS
dB
mVRMS
dB
â 0.1 0.5
%
180 â 450
µH
Notes:
1. Additional testing information is available in âAN569: Si4831/35/36/20/24/25-DEMO Board Test Procedure.â
Volume = maximum for all tests. Tested at RF = 520 kHz and RF = 6 MHz.
2. To ensure proper operation and receiver performance, follow the guidelines in âAN738: Si4825/36-A Antenna,
Schematic, Layout, and Design Guidelines.â Silicon Laboratories will evaluate schematics and layouts for qualified
customers.
3. FMOD = 1 kHz, 30% modulation, 2 kHz channel filter.
4. BAF = 300 Hz to 15 kHz, A-weighted.
5. Guaranteed by characterization.
6. VIN = 5 mVrms.
7. Stray capacitance on antenna and board must be < 10 pF to achieve full tuning range at higher inductance levels.
8. The test is done with Bass/Treble feature not enabled.
Table 6. Reference Clock and Crystal Characteristics
(VDD = 2.7 to 3.6 V, TA = â15 to 85 °C)
Parameter
Symbol Test Condition
Min
Typ
Max
Unit
XTALI Supported Reference Clock
Frequencies
Reference Clock Frequency
Tolerance for XTALI
Reference Clock
â
32.768
â
kHz
â100
â
100
ppm
Crystal Oscillator Frequency
Crystal Oscillator
â
32.768
â
kHz
Crystal Frequency Tolerance
Board Capacitance
â100
â
â
â
100
ppm
3.5
pF
Rev. 1.0
7
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