S-8211EAC-M5T1U Datasheet, PDF (9/29 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC

Rev.2.4_02
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211E Series
3. Detection Delay Time
3. 1 S-8211EAC, S-8211EAH, S-8211EAI, S-8211EAJ, S-8211EAK, S-8211EAP
Table 10
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = +25°C)
Overcharge detection delay time
tCU
Overdischarge detection delay time
tDL
−
0.96 1.2 1.4 s 6
4
−
120 150 180 ms 6
4
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
tCU
Overdischarge detection delay time
tDL
−
0.7 1.2 2.0 s 6
4
−
83 150 255 ms 6
4
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
3. 2 S-8211EAA, S-8211EAB, S-8211EAD, S-8211EAE, S-8211EAF, S-8211EAG
Table 11
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = +25°C)
Overcharge detection delay time
tCU
Overdischarge detection delay time
tDL
−
458 573 687 ^{ms 6}
4
−
240 300 360 ^{ms 6}
4
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
tCU
Overdischarge detection delay time
tDL
−
334 573 955 ^{ms 6}
4
−
166 300 510 ^{ms 6}
4
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
9