S-5840BAG-M5T1X Datasheet, PDF (6/15 Pages) Seiko Instruments Inc – TEMPERATURE SWITCH IC

TEMPERATURE SWITCH IC (THERMOSTAT IC) WITH LATCH
S-5840B Series
Rev.2.1_01
 DC Electrical Characteristics
1. CMOS output product
Table 6
Item
Symbol
Power supply voltage
Detection temperature
Output current
VDD
+TD
IDETH
IDETL
Release voltage for built-in
voltage detector
VR
Hysteresis width for built-in
voltage detector
VHYS
Temperature coefficient
ΔVRET
for built-in voltage detector ΔTa • VRET
Current consumption
during operation
IDD
Condition
−
−
VDD = 3.5 V, _{VDET = 2.7 V}
Apply to DET
pin
VDET = 0.4 V
(Ta = +25°C, unless otherwise specified)
Min.
Typ.
Max.
Unit
Test
Circuit
1.0
−
10.0
V
1
TDET − 2.5
TDET
TDET + 2.5 °C
1
2
9.4
−
mA 2
0.5
2.8
−
mA 2
−
VRET × 0.98 VRET VRET × 1.02 V
−
−
−
VRET × 0.05
−
V
−
Ta = −40°C to +100°C
−
±100
−
ppm/°C −
VDD = 3.5 V
−
12
24
μA
1
2. Nch open drain output product
Table 7
Item
Symbol
Condition
Power supply voltage
VDD
Detection temperature
+TD
Output current
IDETL
ILEAK
Release voltage for built-in
voltage detector
VR
Hysteresis width for built-in
voltage detector
VHYS
Temperature coefficient for ΔVRET
built-in voltage detector
ΔTa • VRET
Current consumption
during operation
IDD
−
−
VDET = 0.4 V, VDD = 3.5 V
VDET = 10.0 V, VDD = 3.5 V
−
−
Ta = −40°C to +100°C
VDD = 3.5 V
(Ta = +25°C, unless otherwise specified)
Min.
Typ.
Max.
Unit
Test
Circuit
1.0
−
10.0
V
1
TDET − 2.5
TDET
TDET + 2.5 °C
1
0.5
2.8
−
mA 2
−
−
100
nA
2
VRET × 0.98 VRET VRET × 1.02 V
−
−
VRET × 0.05
−
V
−
−
±100
−
ppm/°C −
−
12
24
μA
1
 AC Electrical Characteristics
Table 8
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Circuit
Noise suppression time
tnoise
CD = 4.7 nF, VDD = 3.5 V,
Ta = detection temperature
10
30
50
ms
−
6