S-57M1 Datasheet, PDF (6/16 Pages) Seiko Instruments Inc – HIGH-SPEED BIPOLAR HALL EFFECT LATCH

HIGH-SPEED BIPOLAR HALL EFFECT LATCH
S-57M1 Series
 Test Circuits
A
R^*1
100 kΩ
VDD
S-57M1
Series ^OUT
VSS
*1. Resistor (R) is unnecessary for the CMOS output product.
Figure 4 Test Circuit 1
VDD
S-57M1
Series ^OUT
A
VSS
V
Figure 5 Test Circuit 2
VDD
S-57M1
Series ^OUT
A
VSS
V
Figure 6 Test Circuit 3
Rev.1.2_01
6