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S-5842AAAAF-M6T1Y Datasheet, PDF (10/31 Pages) Seiko Instruments Inc – DUAL TRIP TEMPERATURE SWITCH IC
DUAL TRIP TEMPERATURE SWITCH IC (THERMOSTAT IC)
S-5842A Series
Rev.2.3_01
2. Nch open-drain output product
Table 8
Item
Power supply voltage
Detection temperature*1
Difference of detection
temperature*2
Symbol
VDD
TDH or TDL
ΔTD
Condition
Detection temperature
= +20°C to +110°C
Detection temperature
= 0°C to +110°C
Detection temperature
= −10°C to +110°C
−
VDD = 3.5 V
Min.
2.5
2.7
2.8
TDET − 2.5
−
(Ta = +25°C unless otherwise specified)
Typ.
Max.
Unit
Test
Circuit
−
5.5
V
1
−
5.5
V
1
−
5.5
V
1
TDET
TDET + 2.5 °C
1
ΔTDET
−
°C
1
Hysteresis temperature
of DETH pin*3
Hysteresis temperature
of DETL pin*3
Leakage current
of DETH pin
Leakage current
of DETL pin
Output current "L"
of DETH pin
Output current "L"
of DETL pin
Current consumption
during operation
THYSH
THYSL
ILEAKH
ILEAKL
IOLH
IOLL
IDD
VDD = 3.5 V
−
VDD = 3.5 V
−
VDD = 3.5 V, VDETH = 5.5 V
−
VDD = 3.5 V, VDETL = 5.5 V
−
VDD = 3.5 V, VDETH = 0.5 V
0.5
VDD = 3.5 V, VDETL = 0.5 V
0.5
VDD = 3.5 V
−
−5, −2,
+2, +5
−5, −2,
+2, +5
−
−
3.0
3.0
10
−
°C
1
−
°C
1
100
nA
2
100
nA
2
−
mA
2
−
mA
2
16
μA
1
*1. TDET: set value for detection temperature, TDH: actual detection temperature for higher temperature,
TDL: actual detection temperature for lower temperature
Either of two detection temperatures (TDH, TDL), an accuracy of ±2.5°C is set only for the one that user specifies a higher
accuracy than the other (TDH, TDL).
*2. ΔTDET: set value for detection temperature for higher temperature − set value for detection temperature for lower
temperature
ΔTD: actual difference of detection temperature
Set two points of detection temperature so that the difference of detection temperature (ΔTDET) is in 0°C to 65°C. Users are
able to set ΔTDET in 0°C, 5°C, 10°C … 60°C, 65°C.
*3. Users are able to select the hysteresis temperature in −5°C, −2°C, +2°C, or +5°C.
[Fahrenheit ⇔ Celsius Conversion equation]
°C = (°F − 32) × 5 / 9
°F = 32 + °C × 9 / 5

 AC Electrical Characteristics
Item
Noise suppression time
Table 9
Symbol
Condition
tdelay
VDD = 3.5 V,
Ta = detection temperature
Min.
Typ.
Max.
Unit
Test
Circuit
−
550
−
μs
−
10