AATIAN22 Datasheet, PDF(7/11 Page) SiGe Semiconductor, Inc. – 3MHz Fast Transient 400mA Step-Down Converter

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AATIAN22 Datasheet, PDF (7/11 Pages) SiGe Semiconductor, Inc. – 3MHz Fast Transient 400mA Step-Down Converter

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EV-139

AAT1149 EVAL: 3MHz Fast Transient

400mA Step-Down Converter

Test: Startup Using Enable

1. Configure the specified test equipment as shown in Figure 6.

2. Set the oscilloscope to single sequence, and trigger the rising edge of VOUT.

3. Turn on input power supply and toggle EN to the âONâ position while monitoring the EN, VOUT, LX, and

ILOAD on the oscilloscope.

4. Repeat steps 2 and 3 for different IOUT, VIN, and VOUT.

Test: Startup using VIN

1. Configure the specified test equipment as shown in Figure 6.

2. Enable UUT by connecting the jumper to the âONâ position.

3. Set the oscilloscope to single sequence, and trigger the rising edge of VOUT.

4. Disconnect VIN to input power supply.

5. Turn on input power supply and toggle VIN by connecting the banana clip to the power supply while mon-

itoring the VIN, VOUT, LX, and ILOAD on the oscilloscope.

6. Repeat steps 3 through 5 for different IOUT, VIN, and VOUT.

Figure 6: AAT1149 Evaluation Board Connection Diagram for Startup.

EV-139.2007.08.1.0

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