C517A Datasheet, PDF (53/67 Pages) Siemens Semiconductor Group – 8-Bit CMOS Microcontroller

C517A
Power Supply Current
Parameter
Active mode
Idle mode
Active mode with
slow-down enabled
Power-down mode
18 MHz
24 MHz
18 MHz
24 MHz
18 MHz
24 MHz
Symbol Limit Values
typ. ⁹⁾
max. ¹⁰⁾
I_CC
21.3
29.2
I_CC
27.3
37.6
I_CC
11.6
16.2
I_CC
14.6
20.4
I_CC
9.5
13.1
I_CC
10.7
14.9
I_PD
15
50
Unit Test Condition
mA ⁴⁾
mA
mA ⁵⁾
mA
mA ⁶⁾
mA
µA V_CC = 2…5.5 V ³⁾
Notes:
1) Capacitive loading on ports 0 and 2 may cause spurious noise pulses to be superimposed on the V_OL of ALE
and port 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these
pins make 1-to-0 transitions during bus operation. In the worst case (capacitive loading > 100 pF), the noise
pulse on ALE line may exceed 0.8 V. In such cases it may be desirable to qualify ALE with a schmitt-trigger,
or use an address latch with a schmitt-trigger strobe input.
2) Capacitive loading on ports 0 and 2 may cause the V_OH on ALE and PSEN to momentarily fall below the
0.9 V_CC specification when the address lines are stabilizing.
3) I_PD (power-down mode) is measured under following conditions:
EA = RESET = Port 0 = Port 7 = Port 8 = V_CC ; XTAL1 = N.C.; XTAL2 = V_SS ; PE/SWD = OWE = V_SS ;
HWPD = V_CC for software power-down mode; V_AGND = V_SS ; V_AREF = V_CC ; all other pins are disconnected.
I_PD (hardware power-down mode) is independent of any particular pin connection.
4) I_CC (active mode) is measured with:
XTAL2 driven with t_CLCH , t_CHCL = 5 ns , V_IL = V_SS + 0.5 V, V_IH = V_CC – 0.5 V; XTAL1 = N.C.;
EA = PE/SWD == V_SS ; Port 0 = Port 7 = Port 8 = V_CC ; HWPD = V_CC ; RESET = V_CC ; all other pins are
disconnected.
5) I_CC (idle mode) is measured with all output pins disconnected and with all peripherals disabled;
XTAL2 driven with t_CLCH , t_CHCL = 5 ns, V_IL = V_SS + 0.5 V, V_IH = V_CC – 0.5 V; XTAL1 = N.C.;
RESET = V_CC ; HWPD = Port 0 = Port 7 = Port 8 = V_CC ; EA = PE/SWD = V_SS ;
all other pins are disconnected;
6) I_CC (active mode with slow-down mode) is measured with all output pins disconnected and with all peripherals
disabled; XTAL2 driven with t_CLCH , t_CHCL = 5 ns , V_IL = V_SS + 0.5 V, V_IH = V_CC – 0.5 V; XTAL1 = N.C.;
HWPD = V_CC ; RESET = V_CC ; Port 7 = Port 8 = V_CC ;; EA = PE/SWD == V_SS ; all other pins are disconnected.
7) Overload conditions occur if the standard operating conditions are exceeded, i.e. the voltage on any pin
exceeds the specified range (i.e. V_OV > V_CC + 0.5 V or V_OV < V_SS - 0.5 V). The supply voltage V_CC and V_SS must
remain within the specified limits. The absolute sum of input currents on all port pins may not exceed 50 mA.
8) Not 100% tested, guaranteed by design characterization
9) The typical I_CC values are periodically measured at T_A = +25 °C and V_CC = 5 V but not 100% tested.
10)The maximum I_CC values are measured under worst case conditions (T_A = 0 °C or -40 °C and V_CC = 5.5 V)
Semiconductor Group
53
1997-10-01