C540U_1 Datasheet, PDF (174/200 Pages) Siemens Semiconductor Group – 8-Bit CMOS Microcontroller

Device Specifications
C540U / C541U
Power Supply Current
Parameter
Active mode
Idle mode
Power-down mode
12 MHz
12 MHz
Symbol Limit Values
typ. ⁸⁾
max. ⁹⁾
I_CC
15
TBD
I_CC
TBD
TBD
I_PD
TBD
50
Unit Test Condition
mA ⁴⁾
mA ⁵⁾
µA V_CC = 2…5.5 V ³⁾
Notes :
1) Capacitive loading on ports 0 and 2 may cause spurious noise pulses to be superimposed on the V_OL of ALE
and port 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these
pins make 1-to-0 transitions during bus operation. In the worst case (capacitive loading > 100 pF), the noise
pulse on ALE line may exceed 0.8 V. In such cases it may be desirable to qualify ALE with a schmitt-trigger,
or use an address latch with a schmitt-trigger strobe input.
2) Capacitive loading on ports 0 and 2 may cause the V_OH on ALE and PSEN to momentarily fall below the
0.9 V_CC specification when the address lines are stabilizing.
3) I_PD (power-down mode) is measured under following conditions:
EA = Port 0 = V_CC ; XTAL2 = N.C.; XTAL1 = V_SS ; RESET = V_SS; all other pins are disconnected.
the USB transceiver is switched off;
4) I_CC (active mode) is measured with:
XTAL1 driven with t_CLCH , t_CHCL = 5 ns , V_IL = V_SS + 0.5 V, V_IH = V_CC – 0.5 V; XTAL2 = N.C.;
EA = RESET = Port 0 = Port 1 = V_CC ; all other pins are disconnected.
I_CC would be slightly higher if a crystal oscillator is used (appr. 1 mA).
5) I_CC (idle mode) is measured with all output pins disconnected and with all peripherals disabled;
XTAL1 driven with t_CLCH , t_CHCL = 5 ns, V_IL = V_SS + 0.5 V, V_IH = V_CC – 0.5 V; XTAL2 = N.C.;
EA = RESET = V_ss ; Port 0 = V_CC ; all other pins are disconnected;
6) Overload conditions occur if the standard operating conditions are exceeded, ie. the voltage on any pin
exceeds the specified range (i.e. V_OV > V_CC + 0.5 V or V_OV < V_SS - 0.5 V). The supply voltage V_CC and V_SS must
remain within the specified limits. The absolute sum of input currents on all port pins may not exceed 50 mA.
7) Not 100% tested, guaranteed by design characterization.
8) The typical I_CC values are periodically measured at T_A = +25 ˚C but not 100% tested.
9) The maximum I_CC values are measured under worst case conditions (T_A = 0 ˚C and V_CC = 5.5 V)
Semiconductor Group
11-3
1997-10-01