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AO4607 Datasheet, PDF (3/8 Pages) Alpha & Omega Semiconductors – Complementary Enhancement Mode Field Effect Transistor
AO4607
N-Channel + Schottky Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
STATIC PARAMETERS
BVDSS Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current.
(Set by Schottky leakage)
IGSS
VGS(th)
ID(ON)
Gate-Body leakage current
Gate Threshold Voltage
On state drain current
RDS(ON) Static Drain-Source On-Resistance
ID=250µA, VGS=0V
30
VR=30V
VR=30V, TJ=125°C
VR=30V, TJ=150°C
VDS=0V, VGS=±20V
VDS=VGS ID=250µA
1
VGS=4.5V, VDS=5V
20
VGS=10V, ID=6.9A
TJ=125°C
VGS=4.5V, ID=5.0A
gFS
Forward Transconductance
VDS=5V, ID=6.9A
10
VSD
Body-Diode+Schottky Forward Voltage
IS=1A
IS
Maximum Body-Diode+Schottky Continuous Current
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance (FET+Schottky)
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
VGS=0V, VDS=15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
Qg(4.5V) Total Gate Charge
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body-Diode+Schottky Reverse Recovery Time
Qrr
Body-Diode+Schottky Reverse Recovery Charge
VGS=10V, VDS=15V, ID=6.9A
VGS=10V, VDS=15V, RL=2.2Ω,
RGEN=3Ω
IF=6.9A, dI/dt=100A/µs
IF=6.9A, dI/dt=100A/µs
Typ
0.007
3.2
12
1.9
22.5
31.3
34.5
15.4
0.45
680
131
77
3
13.84
6.74
1.82
3.2
4.6
4.1
20.6
5.2
13.7
4.1
Max
0.05
10
20
100
3
28
38
42
0.5
5.5
820
3.6
16.6
16.5
Units
V
mA
nA
V
A
mΩ
mΩ
S
V
A
pF
pF
pF
Ω
nC
nC
nC
nC
ns
ns
ns
ns
ns
nC
A: The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The value in any
given application depends on the user's specific board design. The current rating is based on the t ≤ 10s thermal resistance rating.
B: Repetitive rating, pulse width limited by junction temperature.
C. The R θJA is the sum of the thermal impedence from junction to lead R θJL and lead to ambient.
D. The static characteristics in Figures 1 to 6 are obtained using 80 µs pulses, duty cycle 0.5% max.
E. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA curve provides
a single pulse rating.
F. The Schottky appears in parallel with the MOSFET body diode, even though it is a separate chip. Therefore, we provide the net forward drop, capacitance
and recovery characteristics of the MOSFET and Schottky. However, the thermal resistance is specified for each chip separately
Rev 4: Sept 2005
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
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