GP2Y3A003K0F Datasheet, PDF (4/10 Pages) Sharp Electrionic Components – Optoelectronic Device

GP2Y3A003K0F
REALIABILITY
The reliability requirements of this device are listed
in Table 1.
Table 1. Reliability
TEST ITEMS
Temperature Cycling
High Temperature and
High Humidity Storage
High Temperature Storage
Low Temperature Storage
Operational Life
(High Temperature)
Mechanical Shock
Variable Frequency Vibration
TEST CONDITIONS
One cycle -40°C (30 min.) to +70°C in 30
minutes, repeated 25 times
+40°C, 90% RH, 500h
+70°C, 500h
-40°C, 500h
+60°C, V_CC = 5 V, 500h
100 m / s², 6.0 ms
3 times / ±X, ±Y, ±Z direction
10-to-55-to-10 Hz i n 1 minute
Amplitude: 1.5 mm
2 h i n e a c h X, Y, Z direction
FAILURE
JUDGEMENT
CRITERIA
Initial × 0.8 > V_O
V_O > Initial × 1.2
SAMPLES (n),
DEFECTIVE (C)
n = 11, C = 0
n = 11, C = 0
n = 11, C = 0
n = 11, C = 0
n = 11, C = 0
n = 8, C = 0
n = 8, C = 0
NOTES:
1. Test conditions are according to Electro-optical Characteristics, shown on page 2.
2. At completion of the test, allow device to remain at nominal room temperature and humidity (non-condensing) for two hours.
3. Confidence level: 90%, Lot Tolerance Percent Defect (LTPD): 20% / 40%.
MANUFACTURER’S INSPECTION
Inspection Lot
Inspection shall be carried out per each delivery lot.
Inspection Method
A single sampling plan, normal inspection level II
based on ISO 2859 shall be adopted.
Table 2. Quality Level
DEFECT
Major Defect
Minor Defect
INSPECTION ITEM and TEST METHOD
Electro-optical characteristics defect
Defect to appearance or dimensions (crack, split, chip, scratch, stain)*
NOTE: *Any one of these that affects the Electro-optical Characteristics shall be considered a defect.
AQL (%)
0.4
1.0
4
Data Sheet