LHF16KA9 Datasheet, PDF (35/52 Pages) Sharp Electrionic Components – Flash Memory 16M (2MB × 8/1MB × 16)

SHARP
LHF16KA9
6.2.2 AC INPUTiiJTPUT TEST CONDITIONS
AC test inputs are driven at 3.OV for a Logic “1” and O.OV for a Logic “0.” Input timing begins, and output timing en&, at 1.5V.
Input rise and fall times (10% to 90%) cl0 ns.
I
Figure 14. Transient Input/Output Reference Waveform for Vcc=5V~0.25V
(High Speed Testing Configuration)
AC test inputs are driven at VOH (2.4 Vm) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH
(2.0 Vm) and VIL (0.8 Vm). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <lo ns.
Figure 15. Transient Input/Output Reference Waveform for Vcc=5V+0.5V
(Standard Testing Configuration)
1.3v
lN914
r
$^RL=3.3kR
-t-
CL Includes Jig
Capacitance
T^{-I- CL}
I
Figure 16. Transient Equivalent Testing
Load Circuit
Rev. 1.9