SGM4727 Datasheet, PDF (7/10 Pages) SG Micro Corp – 9Ω, 500MHz Bandwidth, Dual, SPDT Analog Switch

TEST CIRCUITS (Cont.)
R_S
IN₊
SGM4727
NO1 or NC1
COM1
IN1
OUT₊
C_L
Rise Time Delay = |t_INRISE–t_OUTRISE|
Fall Time Delay = |t_INFALL–t_OUTFALL|
Rise Time to Fall Time Mismatch = |t_OUTFALL–t_OUTRISE|
R_S
IN-
NO2 or NC2
IN2
COM2
OUT-
C_L
V₊
V_IN+
0V
V₊
V_IN-
0V
V₊
V_OUT+
0V
V₊
V_OUT-
ON
0V
t_INFALL
50% ^90%
10%
50%
t_INFALL
50%
90%
10%
50%
t_INRISE
90%
10%
t_INRISE
90%
10%
t_SKEW
Test Circuit 4. Output Signal Skew
Source
Signal
V₊
0.1µF
V₊
NO or NC
COM
IN
GND
Test Circuit 5. Off Isolation
V_OUT
C_L
5pF
７
SGM4727