SGM4157 Datasheet, PDF (7/10 Pages) SG Micro Corp – SPDT 1Ω Analog Switch

TEST CIRCUITS (Cont.)
R_S
IN
SGM4157
NO or NC
COM
IN
Rise Time Delay = |t_INRISE–t_OUTRISE|
OUT Fall Time Delay = |t_INFALL–t_OUTFALL|
Rise Time to Fall Time Mismatch = |t_OUTFALL–t_OUTRISE|
C_L
V₊
V_IN
0V
V₊
V_OUT
0V
t_INFALL
t_INRISE
50% ^90%
10%
t_INFALL
90%
10%
t_INRISE
50%
90%
10%
90%
10%
t_SKEW
Test Circuit 4. Output Signal Skew
Source
Signal
V₊
0.1µF
V₊
NO or NC
COM
IN
GND
Test Circuit 5. Off Isolation
V_OUT
C_L
5pF
７
SGM4157