SGM2324 Datasheet, PDF (3/13 Pages) SG Micro Corp – 1MHz, Quad, General Purpose CMOS Operational Amplifier

MODEL
SGM2324
PACKAGE/ORDERING INFORMATION
ORDER NUMBER
SGM2324YS/TR
SGM2324YTS/TR
SGM2324YS14/TR
SGM2324YTS14/TR
PACKAGE
DESCRIPTION
SO-16
TSSOP-16
SO-14
TSSOP-14
PACKAGE
OPTION
Tape and Reel, 2500
Tape and Reel, 3000
Tape and Reel, 2500
Tape and Reel, 3000
MARKING
INFORMATION
SGM2324YS
SGM2324YTS
SGM2324YS14
SGM2324YTS14
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V+ to V- . . . . . . . . . . . . . . . . . . . . . . . 6V
Storage Temperature Range . . . . . . . . . -65 to +150
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 160
Operating Temperature Range . . . . . . . . -40 to +85
Package Thermal Resistance @ TA = 25
SO-16, θJA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 /W
TSSOP-16, θJA . . . . . . . . . . . . . . . . . . . . . . . . . . . 105 /W
Lead Temperature Range (Soldering 10 sec)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260
ESD Susceptibility
HBM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4000V
MM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400V
CAUTION
This integrated circuit can be damaged by ESD. SG
Micro-electronics recommends that all integrated
circuits be handled with appropriate precautions.
Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance
degradation to complete device failure. Precision
integrated circuits may be more susceptible to
damage because very small parametric changes could
cause the device not to meet its published
specifications.
NOTES
1. Stresses above those listed under Absolute Maximum
Ratings may cause permanent damage to the device. This is
a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the
operational section of this specification is not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
3
SGM2324