KWTS907 Datasheet, PDF (9/15 Pages) Seoul Semiconductor – WHITE SIDE VIEW LED

Rev. 1.00
KWTS907
7. Reliability
(1) TEST ITEMS AND RESULTS
TEST ITEM
Life Test 1
Life Test 2
Thermal Shock
High Temperature Life Test
Test conditions
T_a = 25^°C; I_F = 20 mA
T_a = 25^°C; I_F = 30 mA
-30^°C ~ 85^°C
(30 min) (30 min)
T_a = 85^°C; I_F = 5 mA
Note
1000 hr
500 hr
20 cycle
1000 hr
Number of
Damaged
0/20
0/20
0/50
Reference
EIAJ ED-4701
100 101
EIAJ ED-4701
100 101
EIAJ ED-4701
300 307
0/20
-
Low Temperature Life Test T_a = - 30^°C; I_F = 20 mA
1000 hr
High Temperature Storage T_a = 100^°C
1000 hr
Low Temperature Storage T_a = - 40^°C
1000 hr
High Humidity Heat Life Test T_a = 60^°C; RH = 90%, I_F = 20 mA 500 hr
Humidity Heat Load
Resistance to Soldering Heat
Solder ability (Reflow Soldering)
Temperature Cycle
Moisture Resistance Cycle
ESD
T_a = 85^°C; RH = 85%
T_sld = 260^°C, 10 sec
Pre treatment; 30^°C, 70%, 168 hr
T_sld = 215±5^°C, 3 sec
(Lead Solder)
- 40^°C ~ 25^°C ~ 100^°C ~ 25^°C
(30 min) (5 min) (30 min) (5 min)
25^°C ~ 65^°C ~ - 10^°C
RH = 90%, 24 hr / 1 cycle
Human Body Mode : 1 kV
1000 hr
2 time
1 time
over 95%
100 cycle
10 cycle
1 time
0/20
0/50
0/50
0/20
0/50
0/50
0/50
0/50
0/50
0/50
-
EIAJ ED-4701
200 201
EIAJ ED-4701
200 202
EIAJ ED-4701
100 102
EIAJ ED-4701
100 103
EIAJ ED-4701
301 302
EIAJ ED-4701
303
EIAJ ED-4701
100 105
EIAJ ED-4701
200 203
MIL-STD
888E
(2) CRITERIA FOR JUDGING THE DAMAGE
Item
Symbol
Test Condition
Forward Voltage
V_F
I_F = 20 mA
Reverse Current
I_R
V_R = 5 V
Luminous Intensity
I_V
I_F = 20 mA
U.S.L. : Upper Standard Level, L.S.L. : Lower Standard Level
Criteria for Judgment
Min.
Max.
-
U.S.L × 1.2
-
U.S.L × 2.0
L.S.L × 0.5
-
SSC-QP-7-03-44(갑)
8
SEOUL SEMICONDUCTOR CO., LTD.