|
YG101-IC1_12 Datasheet, PDF (7/14 Pages) Seoul Semiconductor – Surface-mounted chip LED device | |||
|
◁ |
5. Reliability Test
Item
Operating at Room
temperature
Test Conditions
20mA, @25â
Duration Number Of
/ Cycle
Damaged
500 hrs
0/22
Operating at High
temperature
Operating at High
temperature
/ High humidity
20mA, @85â
20mA, @60â,90%
500 hrs
500 hrs
0/22
0/22
Thermal shock test
-40~85â Shift (2hr/cycle)
100 cycle
0/22
Thermal resistance
Test
85â, 85% 24hrs ï¨ Reflow 3 times
(Max 260â 10sec) ï¨ Thermal shock
30 cycle
1 time
0/22
MSL : 2a (30â, 60% : 4 weeks)
*Criterion
Iv
VF
OK
> Initial value * 0.5
Initial value ± 0.1V
Rev. 04
June 2012
WWW.SEOULSEMICON.COM
ììë²í¸ : SSC-QP-7-07-25 (Rev.0.0)
|
▷ |