YG101-IC1 Datasheet, PDF (7/14 Pages) Seoul Semiconductor – Small size suitable for compact appliances

5. Reliability Test
Item
Operating at Room
temperature
Test Conditions
20mA, @25℃
Duration ^{Number Of}
/ Cycle
Damaged
500 hrs
0/22
Operating at High
temperature
Operating at High
temperature
/ High humidity
20mA, @85℃
20mA, @60℃,90%
500 hrs
500 hrs
0/22
0/22
Thermal shock test
-40~85℃ Shift (2hr/cycle)
100 cycle
0/22
Thermal resistance
Test
85℃, 85% 24hrs  Reflow 3 times
(Max 260℃ 10sec)  Thermal shock
30 cycle
1 time
0/22
MSL : 2a (30℃, 60% : 4 weeks)
*Criterion
Iv
V_F
OK
> Initial value * 0.5
Initial value ± 0.1V
Rev. 04
June 2012
WWW.SEOULSEMICON.COM
서식번호 : SSC-QP-7-07-25 (Rev.0.0)