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FR104-II1 Datasheet, PDF (7/13 Pages) Seoul Semiconductor – 1.6*0.8*0.4mm Untinted, Diffused flat mold Dominant Wavelength: 625nm | |||
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5. Reliability Test
Item
Operating at Room
temperature
Test Conditions
â 5mA, @25
Duration Number Of
/ Cycle
Damaged
500 hrs
0/22
Operating at High
temperature
â 5mA, @85
500 hrs
0/22
Operating at High
temperature
/ High humidity
â 5mA, @60 ,90%
500 hrs
0/22
Thermal shock test
â -40~85 Shift (2hr/cycle)
100 cycle
0/22
Thermal resistance
Test
â 85 , 85% 24hrs Reflow 3 times
â (Max 260 10sec) Thermal shock
30 cycle
1 time
0/22
â MSL : 2a (30 , 60% : 4 weeks)
*Criterion
Iv
VF
OK
> Initial value * 0.5
Initial value ± 0.1V
Rev. 08
January 2012
WWW.SEOULSEMICON.COM
ììë²í¸ : SSC- QP- 7- 07- 25 (Rev.0.0)
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